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Director of quality department and inspector of Henan KELAIWEI company attended the material microscopic analysis technology forum meeting

Director of quality department and inspector of Henan KELAIWEI company attended the material microscopic analysis technology forum meeting
Release date:2021-06-28 Views:2

6月24日,徐金成、蔡晓丽参加材料显微技术论坛-品质部

On June 24th, Xu Jincheng, the minister of quality Department of Henan KELAIWEI company, and Cai Xiaoli, the inspector, participated in the material microscopic analysis Technology Forum (Zhengzhou Station) sponsored by opotone group. The forum not only shared the latest technologies such as scanning electron microscope, Desktop electron microscope, argon ion polishing and their application solutions and cases in the field of materials with customers, but also invited industry experts Wang Huimin, Zhang Haifeng, ning Mei and others respectively explained the application solutions of lithium ion battery industry, the failure analysis of metal components under environmental working conditions, the application of scanning electron microscope in the analysis and research of metal materials and so on.

Through this forum, we have deeply studied the imaging principle of field emission scanning electron microscope and its important role in lithium battery industry and material field, which will have a profound impact on our future detection and analysis work.

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